Introduction to Total reflection X ray Fluorescence

Total reflection X-rays fluorescence (TXRF) is a surface elemental analysis technique often used for the ultra-trace analysis of particles, residues, and impurities on smooth surfaces. Due to its exceptionally low detection limits, TXRF has been widely introduced in analytical practice, as a lower cost alternative to other analytical techniques.This learning module is addressed to educational institutions, junior professionals and graduate level, environmental monitoring laboratory specialists, and other specialists involved in trace analysis of liquid samples. The goal of the course is to provide an introduction to the fundamentals of TXRF, as well as to the main specific features of this x-ray fluorescence technique.This course was originally released as TCS-51 in the IAEA series Training Course – CD-ROM”  (https://www.iaea.org/publications/search/type/training-course-series-cd-rom).For additional information please contact: nsil@iaea.org